Application of Atomic Layer Deposition (ALD) in Optical Fiber Sensors

Feb 13.

This talk reports on the recent development of high sensitivity optical fiber refractive index sensors based on atomic layer deposition (ALD) nanofilm.

Contact
Perry Shum, shum@ieee.org
Date
February 13, 20152015-02-13T03:10:00
Location
Singapore
URL
http://www.coft.eee.ntu.edu.sg/Pages/Home.aspx