Facilities unique in the world are available for the detailed study of engineering and manufacturing. Synchrotron light allows for detailed analysis and modelling of strain, cracks and corrosion as well as in situ study of materials during production processing. This research is vital to the development of high performance materials and their use in innovative products and structures.
Brighter LED Displays
- Image courtesy Mike Deal via Flickr: http://bit.ly/1oKuznY
CHESS, Cornell University, USA
Collaborative work between researchers from the Chemistry Department of the University of Florida and the Cornell High Energy Synchrotron Source (CHESS) at Cornell University has resulted in novel way to make colloidal superparticles from oriented nanorods of semiconducting materials. The resultant superparticles exhibit enhanced light emission and polarization, features that are important for fabrication of LED televisions and computer screens. The nucleated superparticles can further be cast into macroscopic polarized films. Using currently available manufacturing techniques, these films promise to increase efficiency in polarized LED television and computer screen by as much as 50%.
Scientists watch nanoparticles grow
- Image courtesy Dipankar Saha/Århus University
PETRA III, DESY, Hamburg, Germany
With DESY’s X-ray light source PETRA III, Danish scientists observed the growth of nanoparticles live. The study shows how tungsten oxide nanoparticles are forming from solution. These particles are used for example for smart windows, which become opaque at the flick of a switch, and they are also used in particular solar cells.
Electron beam instrumentation for FELs
Elettra Sincrotrone Trieste, Italy
Frontier fast dynamics science is strongly founded on accelerator-based pulsed photon sources. The longitudinal electron bunch properties play a crucial role to guarantee high performance of the most advanced accelerator-based facilities. Advanced instrumentation have been designed to control picosecond and sub picosecond electron bunch duration. The simplest and most robust bunch length diagnostics are based on the measurement of coherent radiation power and they are used in existing accelerators to measure the relative variation of the bunch length non-destructively and shot by shot. The resulting information is used in bunch length control feedback loops. The drawback is that for an absolute estimation of the bunch length, external instrumentation like a transverse RF deflecting cavity is usually needed.